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The Nova SEM field emission scope has an imersion lens or through the lens detector for high resoution imaging. Like our other tools it also has an X-ray detector for EDS semi quant work. The tool is especially suited for nano-materials applications.

Features

This is a high resolution tool with a through the lens detector. It really comes into play above 100,000x magnification.

• Field emission electron source, with probe current to 10 nA (high resolution mode), 22 nA (analytical mode)
• Beam acceleration voltages selectable from 200 volts to 30 kilovolts
• Beam deceleration option minimizes beam damage to sensitive specimens, beam impact energy as low as 50 volts

Six electron image signal detectors:

• In-lens secondary electron detector [a.k.a. "immersion" or "through-the-lens" (TLD) secondary electron (SE) detector, TLD-SE]
• In-lens BSE detector (through-the-lens detector, backscatterd electron, TLD-BSE)
• Everhart-Thornley detector (ETD) [conventional "below-the-lens" detector]
• Solid state scanning transmitted electron (STEM) detector
• Gaseous analytical detector (GAD) low kV backscattered electron detector is availabe but not in use yet.
• Low vacuum secondary electron detector (LVD) for use with non-conductive samples

Resolution at optimum working distance:

• 1.0 nm at 15 kV (TLD-SE)
• 1.6 nm at 1 kV (TLD-SE)
• 0.8 nm at 30 kV (STEM)

Motorized 4 axis stage assures precise, reproducible specimen positioning.

X-Ray Energy Dispersive Spectrometer (EDS) for elemental spectra, mapping.